郑长林
发布时间: 2018-01-03     文章作者:     访问次数: 5754

  



郑长林

  

研究员

德国柏林洪堡大学博士(2009)

Humboldt   University of Berlin, Germany

电话:+86-21-31249051

E-mailzcl@fudan.edu.cn

个人网站/Website链接/Link  

  

主要经历:(Experiences)
1999 南京大学学士

2004 南京大学硕士

2009 德国柏林洪堡大学物理系博士

2010 - 2017 澳大利亚莫纳什大学电子显微中心 (MCEM)

Tenured Research Fellow

2017 - 至今复旦大学物理系研究员

教学与研究领域:
研究领域:电子显微学(Electron Microscopy)

主要研究方向:发展基于像差校正的新型透射电子显微学技术(TEM)并应用于凝聚态物理和材料科学研究。

实验手段包括原子尺度球差校正STEMTEM, 双球差校正三维共聚焦电子显微镜(SCEM), 相干电子衍射 (Coherent   CBED), 电子全息Lorentz显微镜, 电子能量损失谱(EELS)EDX, Phase   Imaging, 微分相衬电子显微镜 (DPC), ptychography, 电子束相位及空间调制(Bessel beam, Airy beam等新型电子束)。理论工作集中于研究电子的散射及物理光学过程。

  

Changlin Zheng

Professor

Ph.D.(2009),   Humboldt University of Berlin, Germany.

  

Research Interests:
Developing and applying advanced   electron microscopy techniques to solve problems in condensed matter physics   and material science.

TEM techniques: Aberration corrected TEM/STEM, scanning   confocal electron microscopy (SCEM), EELS and EDX, DPC, electron holography   and Lorentz microscopy, ptychography, coherent CBED, electron phase   modulation and beam shaping (Bessel beam, Airy beam…).

Selected   Publications:
1C. L. Zheng, T.   Petersen, H. Kirmse, W. Neumann, M. Morgan, J Etheridge, Axicon lens for   electrons using a magnetic vortex: The efficient generation of a Bessel beam,   Phys. Rev. Lett. 119 (17), 174801 (2017).    (Editors’ suggestion)

2) C.L. Zheng, H. Kirmse, J. Long, D. Laughlin, M.   McHenry, W. Neumann, Investigation of (Fe, Co) NbB-Based nanocrystalline soft   magnetic alloys by Lorentz microscopy and off-axis electron holography,   Microscopy and Microanalysis 21 (02), 498-509 (2015). (Cover image)

3) C.L. Zheng, Y. Zhu, S. Lazar, J. Etheridge, Fast   imaging with Inelastically scattered electrons by off-axis chromatic confocal   electron microscopy, Phys. Rev. Lett. 112 (16), 166101 (2014).  (Editors’ suggestion and featured in   Physics Today).

4) C.L. Zheng, J. Wong-Leung, Q. Gao, H.H Tan, C.   Jagadish, J. Etheridge, Polarity-driven 3-fold symmetry of GaAs/AlGaAs core   multishell nanowires, Nano Lett. 13 (8), 3742-3748 (2013).

5) C.L. Zheng, J. Etheridge, Measurement of chromatic   aberration in STEM and SCEM by coherent convergent beam electron diffraction,   Ultramicroscopy 125, 49-58 (2013).

6) CL Zheng, K. Scheerschmidt, H. Kirmse, I. Häusler, W.   Neumann, Imaging of three-dimensional (Si, Ge) nanostructures by off-axis   electron holography, Ultramicroscopy 124, 108-116 (2013).



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